Exensio Defect Management Data Sheet

Discover how Exensio® Defect Management can revolutionize your defect analysis process. This advanced solution helps you load, visualize, and analyze defect inspection data across the entire manufacturing lifecycle—from wafer start to final test. With powerful root-cause analysis tools, real-time data alignment, and automation capabilities, Exensio® enables timely defect detection, reducing costly delays and improving yield by up to 30% for compound semiconductors.

Download the free data sheet today to learn how Exensio® can save you time, boost efficiency, and transform defect management into higher profitability.